
ALT Screenshot of the first page of a computer graphics research paper titled “On the Accuracy of Surface Scattering Theories,” by Matthew Avolio, Eugene D’Eon, and Shlomi Steinberg from the University of Waterloo and Nvidia. A large comparison figure dominates the page. Five labeled panels compare photographs of glossy metal surfaces against rendered predictions from two reflection models, “GGX” and “SSA.” Each panel shows checkerboard reflections viewed at grazing angles, progressing from blurry reflections on the left to sharper reflections on the right. Above the panels are colored surface profile graphs, and along the right side are blue-green 3D visualizations of microscopic surface geometry. The caption explains that the renderings are derived from measured surface scans using AFM and profilometry. Below the figure is the beginning of the abstract, which states that the paper evaluates how accurately surface scattering models predict appearance from measured surface geometry.

















