Resolving 2D materials means capturing more than one length scale at once. In the image below, ๐ฃ๐ฎ๐ฟ๐ธ ๐ก๐ซ๐ญ reveals twisted bilayer graphene on SiC with both the atomic honeycomb lattice and the longer-period moirรฉ superlattice visible in the same dataset.
The moirรฉ pattern shows a periodicity of ~1.5 nm, superimposed on the graphene lattice with its characteristic 2.46 ร
interatomic spacing. The FFT confirms both signals simultaneously: inner spots from the moirรฉ periodicity and outer hexagonal spots from the atomic lattice.
For researchers studying twist angle, stacking order, and van der Waals heterostructures, ๐ก๐ซ๐ญ ๐ฏ๐ฟ๐ถ๐ป๐ด๐ ๐ฎ๐๐ผ๐บ๐ถ๐ฐ ๐ฎ๐ป๐ฑ ๐บ๐ผ๐ถ๐ฟรฉ ๐ถ๐บ๐ฎ๐ด๐ถ๐ป๐ด ๐ถ๐ป๐๐ผ ๐ฎ ๐๐๐ฎ๐ฏ๐น๐ฒ, ๐ฝ๐ฟ๐ฎ๐ฐ๐๐ถ๐ฐ๐ฎ๐น ๐๐๐ ๐๐ผ๐ฟ๐ธ๐ณ๐น๐ผ๐.
๐ก๐๐
๐ฝ๐น๐ผ๐ฟ๐ฒ ๐ฃ๐ฎ๐ฟ๐ธ ๐ก๐ซ๐ญ: okt.to/pPaCJG
Image caption: LFM imaging of twisted bilayer graphene on SiC with Park NX1: (a,b,e) atomic lattice + moirรฉ pattern, (c) FFT, (d) graphene lattice.
#AFM #Graphene #2DMaterials #Moirรฉ #Nanotechnology #ParkSystems
How does automation expand what is possible in advanced 2D materials research?
In our new ๐ฐ๐๐๐๐ผ๐บ๐ฒ๐ฟ ๐ฐ๐ฎ๐๐ฒ ๐๐๐๐ฑ๐, ๐ฅ๐ฒ๐ฏ๐ฒ๐ฐ๐ฎ ๐ฅ๐ถ๐ฏ๐ฒ๐ถ๐ฟ๐ผ-๐ฃ๐ฎ๐น๐ฎ๐ of Universitรฉ Paris-Saclay shares how ๐ฃ๐ฎ๐ฟ๐ธ ๐๐ซ๐ฐ๐ฌ ๐๐ถ๐บ๐ฝ๐น๐ถ๐ณ๐ถ๐ฒ๐ ๐ฑ๐ฒ๐บ๐ฎ๐ป๐ฑ๐ถ๐ป๐ด ๐๐๐ ๐๐ผ๐ฟ๐ธ๐ณ๐น๐ผ๐๐ in a busy multi-user lab. Automated probe exchange, reliable mode switching, and precise return to the same region help make complex measurements more reproducible across users.
The case study also highlights how FX40 enables precise mechanical manipulation of sophisticated 2D devices, as demonstrated in controlled angular studies of dynamically rotatable bilayer graphene/hBN heterostructures, recently published in ๐ก๐ฎ๐๐๐ฟ๐ฒ ๐ ๐ฎ๐๐ฒ๐ฟ๐ถ๐ฎ๐น๐ (DOI: 10.1038/s41563-026-02667-7).
๐ ๐ฅ๐ฒ๐ฎ๐ฑ ๐๐ต๐ฒ ๐ฐ๐ฎ๐๐ฒ ๐๐๐๐ฑ๐ ๐ฎ๐ป๐ฑ ๐ฒ๐
๐ฝ๐น๐ผ๐ฟ๐ฒ ๐ฃ๐ฎ๐ฟ๐ธ ๐๐ซ๐ฐ๐ฌ: okt.to/TvzINj
#ParkSystems #FX40 #AFM #2DMaterials #Graphene #hBN #Nanotechnology
Image caption: Park FX40 AFM error-signal images show a dynamically rotatable bilayer graphene/hBN heterostructure at two angular configurations. The hBN rotator was mechanically manipulated with the AFM tip in contact mode to control the relative layer alignment. Images courtesy of Universitรฉ Paris-Saclay and CNRS.
๐๐ผ๐ ๐ฐ๐ฎ๐ป ๐๐ผ๐ ๐๐๐๐ฑ๐ ๐ฏ๐ฎ๐๐๐ฒ๐ฟ๐ ๐ถ๐ป๐๐ฒ๐ฟ๐ณ๐ฎ๐ฐ๐ฒ๐ ๐๐ต๐ถ๐น๐ฒ ๐ฒ๐น๐ฒ๐ฐ๐๐ฟ๐ผ๐ฐ๐ต๐ฒ๐บ๐ถ๐ฐ๐ฎ๐น ๐ฝ๐ฟ๐ผ๐ฐ๐ฒ๐๐๐ฒ๐ ๐ฎ๐ฟ๐ฒ ๐ฎ๐ฐ๐๐๐ฎ๐น๐น๐ ๐ต๐ฎ๐ฝ๐ฝ๐ฒ๐ป๐ถ๐ป๐ด?
Discover how SECCM, conductive AFM, electrochemical AFM and PinPointโข nanomechanical mapping provide complementary information on battery electrodes. The webinar will show how these methods probe solid-electrolyte interphase formation, local nanomechanical properties and real-time volume changes at the nanoscale during operation.
๐ค๐ฆ๐ฝ๐ฒ๐ฎ๐ธ๐ฒ๐ฟ: Prof. Prof. Dr. @Christine Kranz, Ulm University, Germany
๐๐ฅ๐ฒ๐ด๐ถ๐๐๐ฒ๐ฟ: okt.to/KhNjUf
#SECCM #AFM #Electrochemistry #BatteryMaterials #Nanotechnology
At SEMICON West? Meet Park Systems at Booth #245!
Explore in-line AFM metrology for precise wafer measurements and 3D surface characterization, supporting evolving needs in AI and advanced packaging.
๐ Moscone Center, San Francisco | Oct 13โ15
#SEMICONWest #ParkSystems
Conductive AFM on 2D materials faces a demanding challenge: resolving local electrical contrast while preserving atomic-scale structural information in the same scan.
This image of Bernal-stacked bilayer graphene on silicon carbide, acquired on the ๐ฃ๐ฎ๐ฟ๐ธ ๐ก๐ซ๐ญ, shows how much detail conductive AFM can reveal.
๐ง๐๐ผ ๐ณ๐ฒ๐ฎ๐๐๐ฟ๐ฒ๐ ๐๐๐ฎ๐ป๐ฑ ๐ผ๐๐:
๐น Atomic lattice: the top graphene layer shows its hexagonal lattice, with a pitch of about 2.5 ร
.
๐น Moirรฉ pattern: a superstructure with ~1.8 nm periodicity, arising from the lattice mismatch between the carbon buffer layer and the SiC substrate.
The measurement was performed on Park NX1 with a Femto DLPCA-200 current amplifier and using a PPP-EFM probe from @NANOSENSORS.
๐ก๐๐
๐ฝ๐น๐ผ๐ฟ๐ฒ ๐บ๐ผ๐ฟ๐ฒ ๐ฎ๐ฏ๐ผ๐๐ ๐ก๐ซ๐ญ: okt.to/XbIYmc
Sample courtesy of Prof. @Martin Rejhon, Institute of Physics, Charles University, Prague. Thank you for kindly providing the sample!
#AFM #Graphene #2DMaterials #Nanotechnology #ConductiveAFM #ParkSystems #MaterialsScience
Women shape the future of science.
This ๐๐ฑ๐ฎ ๐๐ผ๐๐ฒ๐น๐ฎ๐ฐ๐ฒ ๐๐ฎ๐, Park Systems celebrates women advancing semiconductors, materials and energy research, and affirms equal rights, recognition and opportunities across STEM.
Who inspires your work?
#AdaLovelaceDay #WomenInSTEM
Final Call | PFM Webinar ๐ฌ
Explore PFM fundamentals and advanced techniques including Contact-Resonance PFM and DFRT-PFM for nanoscale characterization of piezoelectric and ferroelectric materials.
๐
October 13, 2026
๐ Register now: okt.to/39BugV
#AFM #PFM #MaterialsScience
[Press Release] Park Systems ๐น๐ฒ๐ฎ๐ฑ๐ ๐๐ต๐ฒ ๐ด๐น๐ผ๐ฏ๐ฎ๐น ๐๐๐ ๐บ๐ฎ๐ฟ๐ธ๐ฒ๐ by revenue for the fourth consecutive year (2022โ2025), according to QY Research AFM Market Report. With 23.8% of global AFM revenue and 340 systems sold in 2025, the company ranked first in revenue and unit shipments.
Building on this leadership, Park Systems has expanded its research-grade AFM portfolio with ๐ก๐ซ๐ญ ๐ณ๐ผ๐ฟ ๐ฎ๐๐ผ๐บ๐ถ๐ฐ-๐๐ฐ๐ฎ๐น๐ฒ ๐ถ๐บ๐ฎ๐ด๐ถ๐ป๐ด under ambient conditions, while broadening its capabilities through ๐ถ๐บ๐ฎ๐ด๐ถ๐ป๐ด ๐๐ฝ๐ฒ๐ฐ๐๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ถ๐ฐ ๐ฒ๐น๐น๐ถ๐ฝ๐๐ผ๐บ๐ฒ๐๐ฟ๐ (๐๐ฆ๐) and ๐ฑ๐ถ๐ด๐ถ๐๐ฎ๐น ๐ต๐ผ๐น๐ผ๐ด๐ฟ๐ฎ๐ฝ๐ต๐ถ๐ฐ ๐บ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ (๐๐๐ ).
These developments come as the global AFM market is forecast to grow from $508.69 million in 2025 to $1.01 billion by 2032, at a compound annual growth rate of 11.23%.
๐ก๐ฅ๐ฒ๐ฎ๐ฑ ๐๐ต๐ฒ ๐ณ๐๐น๐น ๐ฝ๐ฟ๐ฒ๐๐ ๐ฟ๐ฒ๐น๐ฒ๐ฎ๐๐ฒ: okt.to/9Zpweg
#ParkSystems #AFM #Nanometrology #AFMleader
They did it again! ๐ช๐
Another year, another ๐รถ๐๐๐ถ๐ป๐ด๐ฒ๐ป ๐ข๐ฏ๐๐๐ฎ๐ฐ๐น๐ฒ ๐๐ถ๐๐ ๐ฅ๐๐ป for the ๐ฃ๐ฎ๐ฟ๐ธ ๐ฆ๐๐๐๐ฒ๐บ๐ ๐๐ฐ๐ฐ๐๐ฟ๐ถ๐ผ๐ป ๐๐ฒ๐ฎ๐บ. This time, 18 colleagues faced 6 km and 21 obstacles, pushing through nearly three hours of running, climbing, crawling, water, mud and plenty of teamwork.
A tough challenge, a strong team and one more finish line crossed together. Congratulations to everyone who took part and brought the Park Systems team spirit to the course! ๐
Already wondering what challenge comes next... ๐
#ParkSystems #TeamSpirit #ObstacleCityRun #Gรถttingen
One technique rarely answers every question in a complex sample.
๐๐๐ผ๐บ๐ถ๐ฐ ๐๐ผ๐ฟ๐ฐ๐ฒ ๐ ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐, ๐ก๐ฎ๐ป๐ผ-๐๐ฅ ๐๐ฝ๐ฒ๐ฐ๐๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐, ๐๐บ๐ฎ๐ด๐ถ๐ป๐ด ๐ฆ๐ฝ๐ฒ๐ฐ๐๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ถ๐ฐ ๐๐น๐น๐ถ๐ฝ๐๐ผ๐บ๐ฒ๐๐ฟ๐ and ๐๐ถ๐ด๐ถ๐๐ฎ๐น ๐๐ผ๐น๐ผ๐ด๐ฟ๐ฎ๐ฝ๐ต๐ถ๐ฐ ๐ ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ reveal complementary information: from structure and chemistry to thin-film properties and dynamics.
๐Follow Park Systems for multimodal measurement ideas you can apply in the lab.
The @CAS International Semiconductor Conference, IEEE event brings together researchers and engineers working across semiconductor devices, micro- and nanosystems, MEMS, sensors and advanced materials.
We are also pleased to contribute to the scientific program with a plenary presentation by ๐๐ฟ. ๐๐ฎ๐บ๐ฒ๐ ๐๐ฒ๐ฟ๐ณ๐ผ๐ผ๐, Park Systems UK Ltd.:
"๐๐๐ผ๐บ๐ถ๐ฐ ๐๐ผ๐ฟ๐ฐ๐ฒ ๐ ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ ๐ณ๐ผ๐ฟ ๐ก๐ฎ๐ป๐ผ๐๐ฐ๐ฎ๐น๐ฒ ๐ ๐ผ๐ฟ๐ฝ๐ต๐ผ๐น๐ผ๐ด๐ถ๐ฐ๐ฎ๐น ๐ฎ๐ป๐ฑ ๐๐น๐ฒ๐ฐ๐๐ฟ๐ถ๐ฐ๐ฎ๐น ๐๐ต๐ฎ๐ฟ๐ฎ๐ฐ๐๐ฒ๐ฟ๐ถ๐๐ฎ๐๐ถ๐ผ๐ป ๐ผ๐ณ ๐ฆ๐ฒ๐บ๐ถ๐ฐ๐ผ๐ป๐ฑ๐๐ฐ๐๐ผ๐ฟ๐"
Thursday, October 15 | 10:00 | Room 1
The talk will explore emerging AFM applications including ferroelectric and memristive devices, dopant and carrier mapping, buried-interface characterization, and nanoscale chemical analysis using nano-IR spectroscopy.
If you are attending CAS 2026, visit us and @Schaefer SEE Srl to discuss your semiconductor, MEMS and nanoscale characterization challenges.
๐ก๐๐ฒ๐ฎ๐ฟ๐ป ๐บ๐ผ๐ฟ๐ฒ ๐ฎ๐ฏ๐ผ๐๐ ๐ฃ๐ฎ๐ฟ๐ธ ๐ฆ๐๐๐๐ฒ๐บ๐ ๐ฆ๐ผ๐น๐๐๐ถ๐ผ๐ป๐: okt.to/wTBxY6
#semiconductors #AFM #MEMS #nanotechnology #Metrology #DigitalHolographicMicroscopy #ParkSystems
Explore oxide thin films with ISE ๐ฌ
Learn how Imaging Spectroscopic Ellipsometry enables high-resolution mapping of film thickness and optical properties while revealing local variations across oxide thin films.
๐
October 27, 2026
๐ Register: okt.to/bzUWjJ
#ISE #ThinFilms #Metrology
What does fully automated AFM metrology look like? From wafer loading to analysis, ๐ฃ๐ฎ๐ฟ๐ธ ๐ก๐ซ-๐ช๐ฎ๐ณ๐ฒ๐ฟ ๐ฎ๐๐๐ผ๐บ๐ฎ๐๐ฒ๐ ๐ฒ๐ฎ๐ฐ๐ต ๐ธ๐ฒ๐ ๐๐๐ฒ๐ฝ: receiving the host recipe, selecting the probe, aligning the wafer, moving to target sites, measuring and reporting.
Reduce manual intervention and bring repeatable nanoscale metrology into semiconductor production.
๐ก๐ฆ๐ฒ๐ฒ ๐๐ต๐ฒ ๐๐ผ๐ฟ๐ธ๐ณ๐น๐ผ๐. ๐๐ฒ๐ฎ๐ฟ๐ป ๐บ๐ผ๐ฟ๐ฒ: okt.to/QXbUgp
We were excited to meet so many researchers in Boston and see our tools in action at ๐ก๐๐ก๐ข๐๐ฐ๐ถ๐ฒ๐ป๐๐ถ๐ณ๐ถ๐ฐ ๐ฆ๐๐บ๐ฝ๐ผ๐๐ถ๐๐บ ๐๐บ๐ฒ๐ฟ๐ถ๐ฐ๐ฎ๐ ๐ฎ๐ฌ๐ฎ๐ฒ this week.
Park Systems supported live demonstrations and hands-on sessions with advanced ๐๐๐ , ๐๐ถ๐ด๐ถ๐๐ฎ๐น ๐๐ผ๐น๐ผ๐ด๐ฟ๐ฎ๐ฝ๐ต๐ถ๐ฐ ๐ ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐, ๐ฎ๐ป๐ฑ ๐๐บ๐ฎ๐ด๐ถ๐ป๐ด ๐ฆ๐ฝ๐ฒ๐ฐ๐๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ถ๐ฐ ๐๐น๐น๐ถ๐ฝ๐๐ผ๐บ๐ฒ๐๐ฟ๐.
It was great to see participants testing workflows, asking detailed questions, and discussing real applications directly with our team.
We were also pleased to sponsor the ๐๐ฒ๐๐ ๐ฃ๐ผ๐๐๐ฒ๐ฟ ๐๐๐ฎ๐ฟd and recognize outstanding research presented during the symposium.
#ParkSystems #NANOscientific Symposium #NSSAmericas #AFM #DHM #ISE #SPM #Nanoscienceโ
Explore PFM at the nanoscale ๐ฌ
Learn the fundamentals of Piezoresponse Force Microscopy and explore advanced techniques including Contact-Resonance PFM and DFRT-PFM for piezoelectric and ferroelectric materials.
๐
October 13, 2026
๐ Register: okt.to/No9tb3
#AFM #PFM #MaterialsScience
๐๐ผ๐ ๐๐บ๐ฎ๐น๐น ๐ฎ ๐๐ถ๐ฏ๐ฟ๐ฎ๐๐ถ๐ผ๐ป ๐ฐ๐ฎ๐ป ๐๐ถ๐ด๐ถ๐๐ฎ๐น ๐๐ผ๐น๐ผ๐ด๐ฟ๐ฎ๐ฝ๐ต๐ถ๐ฐ ๐ ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ (๐๐๐ ) ๐ฟ๐ฒ๐น๐ถ๐ฎ๐ฏ๐น๐ ๐บ๐ฒ๐ฎ๐๐๐ฟ๐ฒ? In Journal of Physics: Photonics, authors address a key challenge in MEMS vibration mapping: separating real nanoscale motion from measurement noise. They define a rigorous way to determine the DHM detection limit, show how experimental settings affect it, and propose a metric for comparing systems.
To validate their approach, the researchers measured the vibration mode of a phononic crystal, an experiment requiring a ๐ฑ๐ฒ๐๐ฒ๐ฐ๐๐ถ๐ผ๐ป ๐น๐ฒ๐๐ฒ๐น ๐ผ๐ณ ๐ท๐๐๐ ๐ญ ๐ฝ๐ถ๐ฐ๐ผ๐บ๐ฒ๐๐ฒ๐ฟ. This resolution is ๐ณ๐ฟ๐ฒ๐พ๐๐ฒ๐ป๐ฐ๐ ๐ฎ๐ป๐ฑ ๐บ๐ฒ๐ฎ๐๐๐ฟ๐ฒ๐บ๐ฒ๐ป๐ ๐ฏ๐ฎ๐ป๐ฑ๐๐ถ๐ฑ๐๐ต ๐ถ๐ป๐ฑ๐ฒ๐ฝ๐ฒ๐ป๐ฑ๐ฒ๐ป๐.
Because DHM ๐ฐ๐ฎ๐ฝ๐๐๐ฟ๐ฒ๐ ๐๐ต๐ฒ ๐ฒ๐ป๐๐ถ๐ฟ๐ฒ ๐ณ๐ถ๐ฒ๐น๐ฑ ๐ผ๐ณ ๐๐ถ๐ฒ๐ simultaneously, it reveals such small vibration patterns across the structure extremely rapidly, ๐๐ถ๐๐ต๐ผ๐๐ ๐ฝ๐ผ๐ถ๐ป๐-๐ฏ๐-๐ฝ๐ผ๐ถ๐ป๐ ๐๐ฐ๐ฎ๐ป๐ป๐ถ๐ป๐ด
This approach can support more reliable characterization of ๐ ๐๐ ๐ฆ, ๐บ๐ถ๐ฐ๐ฟ๐ผ๐๐ฒ๐ป๐๐ผ๐ฟ๐, ๐ฟ๐ฒ๐๐ผ๐ป๐ฎ๐๐ผ๐ฟ๐, ๐๐น๐๐ฟ๐ฎ๐๐ผ๐ป๐ถ๐ฐ ๐ฑ๐ฒ๐๐ถ๐ฐ๐ฒ๐ ๐ฎ๐ป๐ฑ ๐ฝ๐ต๐ผ๐ป๐ผ๐ป๐ถ๐ฐ ๐๐๐ฟ๐๐ฐ๐๐๐ฟ๐ฒ๐.
๐๐ฅ๐ฒ๐ฎ๐ฑ ๐๐ต๐ฒ ๐ณ๐๐น๐น ๐ฝ๐ฎ๐ฝ๐ฒ๐ฟ: okt.to/oQuc8s
๐ก๐๐
๐ฝ๐น๐ผ๐ฟ๐ฒ ๐ฟ๐ฒ๐น๐ฎ๐๐ฒ๐ฑ ๐๐๐ ๐ฎ๐ฝ๐ฝ๐น๐ถ๐ฐ๐ฎ๐๐ถ๐ผ๐ป๐: okt.to/ZMmcp3
Image caption: DHM vibration-amplitude map of a phononic crystal used to validate picometer-scale detection, with vibration at a resonance node measured down to 1.26 pm.
#DHM #MEMS #Photonics #Microscopy #Microsensors #Phononics
๐ช๐ต๐ฎ๐ ๐ต๐ฎ๐ฝ๐ฝ๐ฒ๐ป๐ ๐ฎ๐ ๐ฒ๐น๐ฒ๐ฐ๐๐ฟ๐ผ๐ฑ๐ฒ ๐ถ๐ป๐๐ฒ๐ฟ๐ณ๐ฎ๐ฐ๐ฒ๐ ๐ฐ๐ฎ๐ป ๐ฑ๐ฒ๐๐ฒ๐ฟ๐บ๐ถ๐ป๐ฒ ๐ต๐ผ๐ ๐๐ต๐ฒ ๐ฒ๐ป๐๐ถ๐ฟ๐ฒ ๐ฏ๐ฎ๐๐๐ฒ๐ฟ๐ ๐ฝ๐ฒ๐ฟ๐ณ๐ผ๐ฟ๐บ๐.
In this webinar, explore how ๐๐ฐ๐ฎ๐ป๐ป๐ถ๐ป๐ด ๐ฒ๐น๐ฒ๐ฐ๐๐ฟ๐ผ๐ฐ๐ต๐ฒ๐บ๐ถ๐ฐ๐ฎ๐น ๐ฝ๐ฟ๐ผ๐ฏ๐ฒ ๐บ๐ถ๐ฐ๐ฟ๐ผ๐๐ฐ๐ผ๐ฝ๐ (๐ฆ๐๐ฃ๐ ) techniques and ๐๐๐ -๐ฏ๐ฎ๐๐ฒ๐ฑ ๐บ๐ฒ๐๐ต๐ผ๐ฑ๐ reveal interfacial and interphase processes that are difficult to capture with alternative techniques. See how nanoscale measurements ๐ฐ๐ผ๐ป๐ป๐ฒ๐ฐ๐ ๐๐๐ฟ๐ณ๐ฎ๐ฐ๐ฒ ๐บ๐ผ๐ฟ๐ฝ๐ต๐ผ๐น๐ผ๐ด๐, ๐บ๐ฒ๐ฐ๐ต๐ฎ๐ป๐ถ๐ฐ๐ฎ๐น ๐ฝ๐ฟ๐ผ๐ฝ๐ฒ๐ฟ๐๐ถ๐ฒ๐ ๐ฎ๐ป๐ฑ ๐ฒ๐น๐ฒ๐ฐ๐๐ฟ๐ผ๐ฐ๐ต๐ฒ๐บ๐ถ๐ฐ๐ฎ๐น ๐ฏ๐ฒ๐ต๐ฎ๐๐ถ๐ผ๐ฟ in emerging battery materials.
๐ค๐ฆ๐ฝ๐ฒ๐ฎ๐ธ๐ฒ๐ฟ: Prof. Prof. Dr. @Christine Kranz, Ulm University, Germany
๐๐ฅ๐ฒ๐ด๐ถ๐๐๐ฒ๐ฟ ๐ป๐ผ๐: okt.to/21neV6
#Electrochemistry #BatteryResearch #AFM #SECCM #EnergyStorage
Every reliable AFM measurement starts before the probe reaches the wafer. Park NX-Wafer ๐ฎ๐๐๐ผ๐บ๐ฎ๐๐ฒ๐ ๐๐ฎ๐ณ๐ฒ๐ฟ ๐๐ฟ๐ฎ๐ป๐๐ณ๐ฒ๐ฟ, ๐ฎ๐น๐ถ๐ด๐ป๐บ๐ฒ๐ป๐, ๐๐ฎ๐ฟ๐ด๐ฒ๐ ๐ฝ๐ผ๐๐ถ๐๐ถ๐ผ๐ป๐ถ๐ป๐ด ๐ฎ๐ป๐ฑ ๐ฝ๐ฟ๐ผ๐ฏ๐ฒ ๐ฒ๐
๐ฐ๐ต๐ฎ๐ป๐ด๐ฒ for 300 mm workflows. Its EFEM supports precise handling, including warped wafers, while the tip exchanger stores up to 24 pre-mounted probes. See wafer handling designed for semiconductor fabs.
๐ก๐๐ฒ๐ฎ๐ฟ๐ป ๐บ๐ผ๐ฟ๐ฒ: okt.to/50kdVi
[๐ก๐ฎ๐ป๐ผ๐๐ฐ๐ฎ๐น๐ฒ ๐๐น๐ฒ๐ฐ๐๐ฟ๐ผ๐ฐ๐ต๐ฒ๐บ๐ถ๐๐๐ฟ๐: ๐ฆ๐๐๐ ๐ช๐ฒ๐ฒ๐ธ / ๐๐ฝ๐ถ๐๐ผ๐ฑ๐ฒ ๐ฑ]
In this example, we use a Park NX20 AFM to perform complementary analysis of the top surface of a Norwegian maple leaf, first in air with conventional AFM and then in a PBS buffer with SICM.
The extreme aspect ratio of pulled glass nanopipettes used in SICM is beneficial when measuring rough surfaces such as leaves while ๐๐ต๐ฒ ๐๐๐ฒ ๐ผ๐ณ ๐ถ๐ผ๐ป ๐ฐ๐๐ฟ๐ฟ๐ฒ๐ป๐ ๐ณ๐ฒ๐ฒ๐ฑ๐ฏ๐ฎ๐ฐ๐ธ ๐ฒ๐ป๐ฎ๐ฏ๐น๐ฒ๐ ๐ฒ๐๐ฒ๐ป ๐๐ฒ๐ฟ๐ ๐๐ผ๐ณ๐ ๐๐๐ฟ๐ณ๐ฎ๐ฐ๐ฒ ๐ณ๐ฒ๐ฎ๐๐๐ฟ๐ฒ๐ ๐๐ผ ๐ฏ๐ฒ ๐ฐ๐ต๐ฎ๐ฟ๐ฎ๐ฐ๐๐ฒ๐ฟ๐ถ๐๐ฒ๐ฑ ๐ถ๐ป ๐น๐ถ๐พ๐๐ถ๐ฑ ๐ฒ๐ป๐๐ถ๐ฟ๐ผ๐ป๐บ๐ฒ๐ป๐๐.
๐ก๐๐ถ๐ป๐ฑ ๐ผ๐๐ ๐บ๐ผ๐ฟ๐ฒ ๐ฎ๐ฏ๐ผ๐๐ ๐ฆ๐๐๐ ๐ต๐ฒ๐ฟ๐ฒโ: okt.to/iPnyMI
#SICM #ScanningIonConductanceMicroscopy #BioImaging #Nanopipette #ScanningProbeMicroscopy #AFM okt.to/OIKbZt
[๐ก๐ฎ๐ป๐ผ๐๐ฐ๐ฎ๐น๐ฒ ๐๐น๐ฒ๐ฐ๐๐ฟ๐ผ๐ฐ๐ต๐ฒ๐บ๐ถ๐๐๐ฟ๐: ๐ฆ๐๐๐ ๐ช๐ฒ๐ฒ๐ธ / ๐๐ฝ๐ถ๐๐ผ๐ฑ๐ฒ ๐ฐ]โ
โScanning ion conductance microscopy (SICM) enables nanoscale imaging of samples under biologically relevant conditions without applying mechanical force, which is especially valuable for cells. Blood platelets change their morphology when activated and forces exerted during conventional AFM imaging can trigger this process artificially.
Using SICM on a Park Systems AFM, platelets can be ๐ถ๐บ๐ฎ๐ด๐ฒ๐ฑ ๐ถ๐ป ๐ฎ๐ป ๐ถ๐๐ผ๐๐ผ๐ป๐ถ๐ฐ ๐ฒ๐ป๐๐ถ๐ฟ๐ผ๐ป๐บ๐ฒ๐ป๐ ๐ถ๐ป ๐๐ต๐ฒ๐ถ๐ฟ ๐ป๐ฎ๐๐ถ๐๐ฒ, ๐๐ป๐ฎ๐ฐ๐๐ถ๐๐ฎ๐๐ฒ๐ฑ ๐๐๐ฎ๐๐ฒ, ๐ฒ๐ป๐ฎ๐ฏ๐น๐ถ๐ป๐ด ๐๐ต๐ฒ๐ถ๐ฟ ๐ฎ๐ฐ๐๐ถ๐๐ฎ๐๐ถ๐ผ๐ป ๐๐ผ ๐ฏ๐ฒ ๐๐๐๐ฑ๐ถ๐ฒ๐ฑ ๐ถ๐ป ๐๐ถ๐๐.
๐ก๐๐ถ๐ป๐ฑ ๐ผ๐๐ ๐บ๐ผ๐ฟ๐ฒ ๐ฎ๐ฏ๐ผ๐๐ ๐ฆ๐๐๐ ๐ถ๐บ๐ฎ๐ด๐ถ๐ป๐ด ๐ผ๐ณ ๐ฏ๐ถ๐ผ๐น๐ผ๐ด๐ถ๐ฐ๐ฎ๐น ๐ฐ๐ฒ๐น๐น๐ ๐ต๐ฒ๐ฟ๐ฒโ: okt.to/ecE4zT
#SICM #ScanningIonConductanceMicroscopy #LiveCellImaging #BioImaging #CellBiology #Platelets #ScanningProbeMicroscopy

























